FORESITE公司在美國是具有有影響力的性的專業(yè)級之檢測實(shí)驗(yàn)室，它可提供以下專業(yè)的檢測測試。
測試各式電子產(chǎn)品之正負(fù)離子殘留值，并提供專業(yè)的檢測報(bào)告。
檢測方式：IPC TM 650.2.3.28 (Ionic Analysis of circuit boards,ion chrom atography method)
C3用途
Monitoring tool for production floor
Focus on sensitive area of concern (0.1 in2)
聚焦在問題的萃取面積為0.1in2
Performs electrical test and gives immediate ‘clean’ or ‘dirty’ reading based on Foresite recommended limits for ionic contamination
進(jìn)行電氣測試并在Foresite建議的離子污染限值基礎(chǔ)上給予“清潔”或“污染”的清潔度判定結(jié)果
Localized extraction method for Ion Chromatography
Extracts sample from localized testing area using deionized steam
使用去離子水蒸汽萃取局部測試區(qū)的樣品
Samples can be shipped to a lab for Ion Chromatography analysis
萃取后的樣品直接進(jìn)行IC分析
C-3測試元件操作：for IC( 離子濃度色譜分析儀)
Localized Extraction by C3 & Test per IPC-TM- 650 Standard 2.3.28
C3局部萃取法IPC-TM- 650 Standard 2.3.28
Uses D.I. Water (Steam) 使用DI水（蒸汽）
Dilution factor for I.C. is based on Cell Aperture (0.1in2)
IC的稀釋因子取決于測試頭的孔徑(0.1in2)
Dilution factor is (2.2mL / 0.1in2 = 22)
稀釋因子計(jì)算公式是 (2.2ml/0.1in2=22)
For Populated Boards add 10% (2.2mL / 0.11in2 = 20)
對于組裝后的板面積需要增加10%（2.2ml/0.11in2=20)
離子測試曲線
測試吸嘴
